Patents (8)
1. Method of
Determination of Energy Parameters of High-Resistivity Electrooptic
Semiconductors
V.N.
Astratov, A.V. Ilinskii, and A.S. Furman
Patent
No 1833054 (In
2. Method of
Measurements of Carriers Drift Mobility in High-Resistivity Semiconductors
V.N. Astratov, A.S. Furman, and A.V.
Ilinskii
Patent No 1604099 (in
3. Method of
Measurements of Electrical Parameters of High-Resistivity Semiconductors
V.N. Astratov, A.V. Ilinskii, and M.B.
Melnikov
Patent No 1487754 (in
4. Method of
Measurements of Population of Trapping Levels in High-Resistivity
Semiconductors
V.N. Astratov, A.V. Ilinskii, and M.B.
Melnikov
Patent No 1468327 (in
5. Method of
Conductivity Measurements in High-Resistivity Semiconductors
V.N. Astratov, A.V. Ilinskii, M.B.
Melnikov, S.N. Reznikov, and I.N. Hootorskoy
Patent No 1400391 (in
6. Method of Measurements of Quantum Yield of
Photo-Effect in High-Resistivity Semiconductors
V.N. Astratov, A.V. Ilinskii, and M.B.
Melnikov
Patent No 1289322 (in
7. Method of
Determination of Energy of Trapping Levels in High-Resistivity
V.N. Astratov, A.V. Ilinskii, M.B.
Melnikov, O.M. Rusakov, S.N. Reznikov, and L.N. Linnik
Patent No 1235408 (in
8. Method of Determination of Distribution of
Electric Field by Transverse Electrooptic Effect in
V.N. Astratov, A.V. Ilinskii, L.N. Linnik,
and S.N. Reznikov
Patent
No 1045728 (in