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Patrick J. Moyer
Associate Professor |
Research Areas Course
Information
· Single molecule microscopy and spectroscopy Sports and Physics – PHYS 1201
· Nanoscale plasmon optics
· Optical spectroscopy of nanoscale systems
· Quantum dot photophysics
Research Group
Group Photo
Wes Parker, PhD student in Optical Science and Engineering
Program
Sharonda Johnson, PhD student in Nanoscale
Science Program
Ryan Hefti, PhD student in Nanoscale
Science Program
Professional Experience
Selected Publications
Ø Wesley C. Parker, Nilay
Chakraborty, Regina Vrikkis, Gloria Elliott, Stuart
Smith, and Patrick J. Moyer, “High resolution intracellular viscosity
measurement using time-dependent fluorescence anisotropy”, Optics Express 18,
16607-16617 (2010).
Ø W. Williams, B. Mullany, W. Parker, P.
Moyer, and M. Randles, “Using Quantum Dots to
Evaluate Subsurface Damage Depths and Formation Mechanisms in Glass”, Annals of CIRP 59, (2010).
Ø Wesley B. Williams, Brigid A. Mullany,
Wesley C. Parker, Patrick J. Moyer, and Mark H. Randles,
“Using quantum dots to tag subsurface damage in lapped and polished glass
samples”, Appl. Opt. 48, 5155 (2009).
Ø Feilong Lin, Kevin E. Elliott, Wes Parker, Nilay Chakraborty, Chek Sing Teo, Stuart T. Smith,
Gloria D. Elliott, and Patrick J. Moyer, “Confocal
and force probe imaging system for simultaneous three-dimensional optical and
mechanical spectroscopic evaluation of biological samples”, Rev. Sci. Instrum.
80, 55110 (2009).
Ø Nilay Charkraborty, Debasree Biswas, Wesley Parker,
Pat Moyer, Gloria D. Elliott, “A role for microwave processing in the dry
preservation of mammalian cells”, Biotechnology
and Bioengineering 100, 782
(2008).
Ø Je Hong Kim and Patrick J. Moyer,
“Laser-induced fluorescence within subwavelength
metallic arrays of nanoholes indicating minimal
dependence on hole periodicity”, Appl.
Phys. Lett. 90, 131111 (2007).
Ø Kevin Elliott, Stuart Smith, Gloria Elliott, Patrick Moyer, “Combined Force Mapping and Fluorescence Microscopy System to Study Molecular Dynamics in Live Cells”, The 7th International Conference of the European Society for Precision Engineering and Nanotechnology (Euspen), Bremen, Germany, May 20-24, 2007, vol. 1. pp. 41-44. (oral presentation by Kevin Elliott).
Ø Je Hong Kim and Patrick J. Moyer,
“Transmission characteristics of metallic equilateral triangular nanohole arrays”, Appl.
Phys. Lett. 89, 121106 (2006).
Ø Je Hong Kim and Patrick J. Moyer, “Thickness
effects on the optical transmission characteristics of small hole arrays on
thin gold films”, Optics
Express 14, 6595-6603 (2006).
Ø Je Hong Kim and Patrick J. Moyer,
“Experimental demonstration of replicated multimode interferometer power
splitter in Zr-doped sol-gel”, J. Lightw. Technol. 24, 612 (2006).
Ø Patrick J. Moyer, Andy Pridmore, and Faramarz Farahi, “Multimode Interference (MMI) switch design with low manufacturing tolerance”, Optical Engineering, 43, 178 (2004).
Ø Patrick J. Moyer, Timothy Martin, Andy Pridmore, Jan Schmidt, Thomas Hasche, and Lukas Eng, “Dependence of radiative lifetimes of porous silicon on excitation intensity and wavelength”, Appl. Phys. Lett. 76, 2683 (2000).
Ø Patrick J. Moyer, Jan Schmidt, Lukas Eng, Alfred J. Meixner, Gunther W. Sandmann, Hartmut Dietz, and Waldfried Plieth, “Surface enhanced Raman scattering spectroscopy of carbon domains on individual Ag nanoparticles on a 25 millisecond time scale”, J. Am. Chem. Soc. 122, 5409 (2000).
Ø Patrick J. Moyer, Todd L. Cloninger, James L. Gole, and Lawrence A. Bottomley, “Experimental evidence for molecule-like absorption and emission of porous silicon using near-field an far-field optical spectroscopy”, Phys. Rev. B60, 4889 (1999).
Ø Eric Ayars, David Aspnes, Patrick Moyer, and M.A. Paesler, “Proximal Electromagnetic Shear Forces”, J. of Microscopy, 196, 59 (1999).
Ø P.I. James, L.F. Garfias-Mesias, P.J. Moyer, and W.H. Smyrl, “Scanning Electrochemical Microscopy with Simultaneous Independent Topography”, J. Electrochem. Soc. 145, L64-L66 (1998).
Ø Michael A. Paesler and Patrick J. Moyer, Near-field Optics: Theory, Instrumentation, and Applications, Wiley-Interscience, 1996.
Ø Patrick J. Moyer and Stefan Kammer, "High resolution imaging using near-field scanning optical microscopy and shear force feedback in water", Appl. Phys. Lett 68, 3380-3382 (1996).
Ø Patrick J. Moyer, Karsten Walzer, and Michael Hietschold, "Modification of the optical properties of liquid crystals using near-field scanning optical microscopy", Appl. Phys. Lett. 67, 2129-2131 (1995).
Education
Ph.D., Physics, North
Carolina State University, Raleigh, NC (1993)
M.S., Physics, Saint Bonaventure University,
Olean, NY (1988)
B.S., Physics, Moravian College,
Bethlehem, PA (1986)