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Patrick J. Moyer
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Research Areas
· Single molecule microscopy and spectroscopy
· Nanoscale plasmon optics
· Optical spectroscopy of nanoscale systems
· Near-field Scanning Optical Microscopy (NSOM)
Professional Experience
- Associate Professor, Department of Physics and Optical Science, UNC Charlotte (2001 – present)
- Director of
Photonic Development, Waveguide Solutions,
- Assistant Professor, Department of Physics, UNC Charlotte (1996-2001)
- Assistant Professor, Department of Physics, Brooklyn College of the City University of New York (1995-1996)
- Staff
Scientist, TopoMetrix Corporation,
Selected Publications
Ø
Je Hong
Kim and Patrick J. Moyer, “Transmission characteristics of metallic equilateral
triangular nanohole arrays”, Virtual
Journal of Nanoscale Science and Technology 14, Issue 14, October 2, 2006.
Ø
Je Hong
Kim and Patrick J. Moyer, “Transmission characteristics of metallic equilateral
triangular nanohole arrays”, Appl. Phys.
Lett. 89, 121106 (2006).
Ø
Je Hong
Kim and Patrick J. Moyer, “Thickness effects on the optical transmission
characteristics of small hole arrays on thin gold films”, Optics Express
14, 6595-6603 (2006).
Ø Je Hong Kim, Bruce W. Dudley, and Patrick J. Moyer, “Experimental demonstration of replicated multimode interferometer power splitter in Zr-doped sol-gel”, J. Lightwave Technol. January (2006).
Ø Patrick J. Moyer, Andy Pridmore, and Faramarz Farahi, “Multimode Interference (MMI) switch design with low manufacturing tolerance”, Optical Engineering, 43, 178 (2004).
Ø Patrick J. Moyer, Timothy Martin, Andy Pridmore, Jan Schmidt, Thomas Hasche, and Lukas Eng, “Dependence of radiative lifetimes of porous silicon on excitation intensity and wavelength”, Appl. Phys. Lett. 76, 2683 (2000).
Ø Patrick J. Moyer, Jan Schmidt, Lukas Eng, Alfred J. Meixner, Gunther W. Sandmann, Hartmut Dietz, and Waldfried Plieth, “Surface enhanced Raman scattering spectroscopy of carbon domains on individual Ag nanoparticles on a 25 millisecond time scale”, J. Am. Chem. Soc. 122, 5409 (2000).
Ø Patrick J. Moyer, Todd L. Cloninger, James L. Gole, and Lawrence A. Bottomley, “Experimental evidence for molecule-like absorption and emission of porous silicon using near-field an far-field optical spectroscopy”, Phys. Rev. B60, 4889 (1999).
Ø Eric Ayars, David Aspnes, Patrick Moyer, and M.A. Paesler, “Proximal Electromagnetic Shear Forces”, J. of Microscopy, 196, 59 (1999).
Ø P.I. James, L.F. Garfias-Mesias, P.J. Moyer, and W.H. Smyrl, “Scanning Electrochemical Microscopy with Simultaneous Independent Topography”, J. Electrochem. Soc. 145, L64-L66 (1998).
Ø Michael A. Paesler and Patrick J. Moyer, Near-field Optics: Theory, Instrumentation, and Applications, Wiley-Interscience, 1996.
Ø Patrick J. Moyer and Stefan Kammer, "High resolution imaging using near-field scanning optical microscopy and shear force feedback in water", Appl. Phys. Lett 68, 3380-3382 (1996).
Ø Patrick J. Moyer, Karsten Walzer, and Michael Hietschold, "Modification of the optical properties of liquid crystals using near-field scanning optical microscopy", Appl. Phys. Lett. 67, 2129-2131 (1995).
Education
Ph.D., Physics, North
Carolina State University, Raleigh, NC (1993)
M.S., Physics, Saint Bonaventure University,
Olean, NY (1988)
B.S., Physics, Moravian College,
Bethlehem, PA (1986)
Last update 18 November 2006